7109A Plug & Play Accelerometer

Brand: American Sensor Technologies Inc

7109A Plug & Play Accelerometer

Brand: American Sensor Technologies Inc
The Model 7109A is a miniature stud mount IEPE shock accelerometer available in ±5,000 to ±20,000 g ranges.

The accelerometer features a welded hermetic stainless steel construction with an integral cable for electrical connection. The model 7109A incorporates a stable piezoceramic crystal in annular shear mode with outstanding linearity for shock measurements. The accelerometer has an operating range of 0° to 85°C and a flat frequency response to >10 kHz.
Features
  • ±5,000 to ±20,000 g Dynamic Range
  • Welded Stainless Steel
  • Hermetically Sealed
  • 0° to 85°C Operating Range
  • Annular Shear Mode
  • Case Isolated, Internally Shielded

Specifications

Approvals & Certifications

  • CE
  • RoHS

Bandwidth

  • > 10 kHz

Cable Material

  • PFA

Current

  • 2-10 mA - Excitation Current

Electrical Connectors

  • 32 AWG PFA Insulated Leads, Braided Shield, PFA Jacket

Enclosure, Body Material

  • Stainless Steel

Frequency

  • 2 to 10,000 Hz

Insulation Resistance

  • > 50 megaohms at 100 Vdc

Load Impedance

  • < 100 ohms

Mounting

  • #10-32 or M5 x 0.8 Mounting Stud

NACE & NIST

  • NIST Traceable Amplitude Calibration

Non-Linearity

  • ± 1 % of Full Scale Output

Operating Temperature

  • 0° to 85° C (32° to 185° F)

Operating Voltages

  • 18-30 Vdc - Compliance Voltage

Output

  • ± 5 V - Full Scale Output

Output Noise

  • 0.03 to 0.06 G RMS - Residual (Broadband 1 Hz to 10 kHz)

Response Time

  • Discharge Time Constant: 1 to 3 seconds
  • Warm-Up Time: < 5 seconds

Sensitivity

  • < 5 % - Transverse Sensitivity
  • 0.25 to 1 mV/g

Sensor, Probe Material

  • Ceramic (Shear Mode)

Shock

  • ± 50,000 G

Storage Temperature

  • -55° to 125° C (-67° to 257° F)

Supply Voltage

  • Bias Voltage: 6-13 Vdc
  • Bias Voltage: 8-12 Vdc

Torque

  • 18 In/Lbs - Mounting

  • Drop Testing
  • Far-Field Shock Testing
  • Impact Testing
  • Structural Testing
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